SN74BCT8373ANT - IC SCAN TEST DEVICE LATCH 24-DIP
Nombor Bahagian pengilang
Nombor Bahagian dalaman
pengeluar
Penerangan ringkas
IC SCAN TEST DEVICE LATCH 24-DIP
Rosh Status
Memimpin percuma / RoHS Compliant
Masa penghantaran
1-2 hari
kuantiti disediakan
16000 Pieces
Harga rujukan
Harga kami
- (Sila hubungi kami untuk harga yang lebih baik: [email protected])
- AX Semiconductor mempunyai SN74BCT8373ANT dalam stok untuk menjual.
- Pilihan penghantaran dan penghantaran masa:
- DHL: 2-3 days.
- FEDEX: 2-3 days.
- UPS: 2-4 days.
- TNT: 3-5 days.
- EMS: 5-8 days.
- Normal Post: 10-15 days.
- Pilihan pembayaran:
- Paypal (Credit Card)
- Bank Transfer (Wire Transfer)
- Western Union
- MoneyGram
spesifikasi bagi SN74BCT8373ANT
Jaminan kualiti :
jaminan 365 hari
Sumber saham :
Francais Pengedar / Pengilang Direct
Negara asal :
USA / TAIWAN / MEXICO / MALAYSIA / PHI
Nombor Bahagian :
SN74BCT8373ANT
pengeluar :
Texas Instruments
Penerangan :
IC SCAN TEST DEVICE LATCH 24-DIP
Siri :
74BCT
Status Bahagian :
Obsolete
Jenis Logik :
Scan Test Device with D-Type Latches
Voltan bekalan :
4.5V ~ 5.5V
Bilangan bit :
8
Suhu Operasi :
0°C ~ 70°C
Jenis Pemasangan :
Through Hole
Pakej / Kes :
24-DIP (0.300", 7.62mm)
Pakej Peranti Pembekal :
24-PDIP
Berat :
-
Keadaan :
Baru dan asli
dokumen untuk SN74BCT8373ANT
Helaian data :
SN74BCT8373ANT.pdf
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